Characteristics of Al-doped TiO2 thin films grown bypulsed laser deposition

Type : Publication
Auteur(s) :  Faouzi HANINI, Yacine BOUACHIBA, Fouad KERMICHE, Adel TAABOUCHE, Abderrahmane BOUABELLOU, Tahar KERDJA, Kamel Boukheddaden
Année :  2013
Domaine : Sciences des matériaux
Revue : Int. J. Nanoparticles
Résumé en PDF :  (résumé en pdf)
Fulltext en PDF :  (.pdf)
Mots clés :  Al-doped TiO2, structure, morphology, optical properties, waveguide, nanoparticles

Résumé : 

Al-doped TiO2 (TiO2:Al) thin films were deposited at 450ºC ontoglass substrates using pulsed laser deposition method. X-rays diffractionspectra showed that the obtained films are polycrystalline of anatase structurewith preferential orientation of (101) direction. AFM images, nanoparticles sizeand surface roughness mean square values showed that the surfaces of TiO2:Alfilms are smoother than that of undoped TiO2 films. A blue shift in theabsorption edge of TiO2 with increasing Al concentration in the film isnoteworthy as it leads to increase in the width of the optical transmission. Theoptical waveguiding performances of the TiO2:Al films were demonstrated byusing the m-lines spectroscopy technique and the results were correlated to thestructural properties. Spectroscopic ellipsometry was used to extract the opticalconstants of the films. The determined band gap of undoped and Al doped filmsvaries from 3.43 to 3.61 eV, which is in accordance to Burstein-Moss shift.