Structural, optical and electrical properties of TiO2 thin films synthesized by sol–gel technique

Auteurs :  F. Hanini, A. Bouabellou, Y. Bouachiba, F. Kermiche, A. TAABOUCHE, M. Hemissi, and D. Lakhdari
Année : 2013
Domaine : Sciences des matériaux
Type : Article de journal
Revue : IOSR Journal of Engineering (IOSRJEN)
Résumé en PDF :  (résumé en pdf)
Fulltext en PDF :  (.pdf)
Mots clés : TiO2Thin films, Annealing, DRX, anatase, Optical property, resistivity

Résumé : 

The influence of annealing temperature on the structure, optical and electrical property of TiO thinfilms with (101) preferential orientation were deposited on glass substrates by sol–gel technique has beenstudied. As-deposited films were amorphous, and the XRD studies showed that the formation of anatase phasewas initiated at annealing temperature close to 400 °C. The grain size of the film annealed at 550 °C was about22 nm. The transmission spectra, recorded in the UV visible range reveal a relatively high transmissioncoefficient (~70%) in the obtained films. The transmittance data analysis indicates that the optical band gap (E)is closely related to the annealing temperature, an indirect band gap ranging from 3.43 eV to 3.04 eV wasdeduced. The electrical resistivity measurement that were carried out in function of the annealing temperature showed a sharp decrease in resistivity was found to be 0.0802 .cm.2g