Flaw Detection in Ultrasonics Using Wavelets Transform and Split Spectrum processing

Type : Article de conférence
Auteur(s) :  DRAI Redouane, Khelil Mohamed, Benchaala Amar
Année :  2000
Domaine : Electronique
Conférence: 15th World conference on NDT. 15-21 Oct. 2000, Rome Italie
Lieu de la conférence: 
Résumé en PDF :  (résumé en pdf)
Fulltext en PDF :  (.pdf)
Mots clés :  NDT, Ultrasonics, Split spectrum techniques, continuous wavelets transform, digital wavelets

Résumé : 

In ultrasonic techniques, information on defects characterization possibilities have required more evolved techniques development than classical methods. to obtain a high probability of defect detection, these methods use signal processing algorithms in order to enhance signal to noise ration. In this paper, some signal processing algoritms mike split spectrum processing (SSP) and wavelets are developed and implemented on computer allowing their utilization in ultrasonics NDT results processing.