Type : Article de conférence
Auteur(s) :  T. Merazi Meksen, R. Drai, F. SELLIDJ
Année :  2003
Domaine : Electronique
Conférence: World Conference on Ultrasonics (WCU'2003)
Lieu de la conférence:  Paris, France
Résumé en PDF :  (résumé en pdf)
Fulltext en PDF : 
Mots clés :  Non destructive testing, Ultrasonic imagery, Edge detection, Hough transform

Résumé : 

In non destructive testing of materials, the ultrasonic imagery is a field in full rise. Indeed , more than one convivial representation of the results , the operations of detection , localization and sizing of the defects can be carried out automatically by the analysis of synthesized images. The problem breaks up in general into a phase of preprocessing to only limit the quantity of information to useful and a processing phase in order to characterize the defect. In our article, we will briefly describe the the ultrasonic images formation said C-SCAN and TOFD, before seeing how a high pass filtering makes it possible to reduce the image c-scan to the only points of the defect edges. This preprocessing reduces considerably calculations for using the Hough transform in patterns recognition of defects in the case of C-SCAN image , and the localization of cracks in the case of the TOFD image