STUDY OF STRUCTURAL , OPTICAL AND ELECTRICAL PROPERTIES OF ZnO THIN FILMS PREPARED
Type : Article de conférence
Auteur(s) : , , , , , , , ,
Année : 2018
Domaine : Sciences des matériaux
Conférence: Fourth International Conference on ENERGY, MATERIALS, APPLIED ENERGETICS AND POLLUTION. ICEMEAP’2018
Lieu de la conférence: Constantine, Algérie
Résumé en PDF :
Fulltext en PDF :
Mots clés : Thin films, ZnO, Cobalt, Dip-Coating, XRD, AFM, UV-Visible absorption.
Auteur(s) : , , , , , , , ,
Année : 2018
Domaine : Sciences des matériaux
Conférence: Fourth International Conference on ENERGY, MATERIALS, APPLIED ENERGETICS AND POLLUTION. ICEMEAP’2018
Lieu de la conférence: Constantine, Algérie
Résumé en PDF :
![(résumé en pdf)](https://library.crti.dz/images/blue-document-pdf-text.png)
Fulltext en PDF :
![(.pdf)](https://library.crti.dz/images/blue-document-pdf-text.png)
Mots clés : Thin films, ZnO, Cobalt, Dip-Coating, XRD, AFM, UV-Visible absorption.
Résumé :
ABSTRACTIn this work, we studied deposited Cobalt- doped ZnO thin films via dip-coatingtechnique onto glass substrate, Zinc acetate dehydrate, cobalt acetate, 2-methoxyethanol andmonoethanolamine were used as starting materials. The obtained thin films here characterizedby X-ray diffraction, UV- visible absorption, Atomic force microscopy (AFM). It is foundthat all the thin films have good crystallinity and a preferential orientation o f crystallitesalong [002] axis of ZnO with wurtzite structure. The AFM have provided the information onmorphology of this films where the size grain and average surface roughnes (Rms).