Structural study of Al-doped ZnO thin films produced by the sol-geltechnique

Auteurs :  Fayssal BOUFELGHA, N. Brihi, A. BOUAINE, R. Zellagui, N. OUAFAK, et A. BOUGUELLOTE
Année : 2018
Domaine : Physique
Type : Communication
Conférence: International Conference of Computer Science and Renewable Energies "ICCSRE'2018"
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Mots clés : Thin films, spin coater, ZnO / Al, XRD, SEM, UV-visible

Résumé : 

In this work we studied the effect of aluminum doping concentration on the structural properties of zinc oxidethin films, we deposited samples of ZnO and aluminum doped ZnO with a doping rate of 1, 2, 3, 4 and 5%,on glass substrates by the spin coating technique. The structural characterization of the samples is done by theXRD and SEM techniques, the XRD spectra show that the layers are polycrystalline with a hexagonalwürtzite structure, and a preferred orientation in the plane (002), and for the doping 5% the structure is almostmonocrystaline (002). SEM images are used to confirm grain sizes and surface conditions. Opticalcharacterization is done by UV-visible spectroscopy, gives a good visible transmittance up to 80% andexceeds 90% for 2% doping, and the gap varies with the doping variation with a small gap for the samedoping (2%)