A comparative study of potentiostatic and pulsed Electrodeposition of ZnS nanostructures

Type : Article de conférence
Auteur(s) :  K. Ghezali, B. Boudine, L. Mentar, A. Azizi
Année :  2016
Domaine : Sciences des matériaux
Conférence: 7th African Conference on Non Destructive Testing (ACNDT) & the 5th International Conference on NDT and Materials Industry and Alloys (IC-WNDT-MI)
Lieu de la conférence:  Oran, Algeria
Résumé en PDF :  (résumé en pdf)
Fulltext en PDF :  (.pdf)
Mots clés :  ZnS, Mott-schottky, pulse, potentiostatic, XRD

Résumé : 

Electrochemical, structural and optical properties of ZnS thin films deposited by either potentiostatic or pulsed electrodeposition were investigated. The grown thin films of ZnS from the both processes were studied by means of Mott-Schottky (MS), AFM, XRD, Raman and UV-Vis spectrometry. The deposits of ZnS were grown using an aqueous solution containing 10-3M Na2S2O3 and 10-4M ZnSO at pH=2,4. The electronic properties using Mott-Schottky confirm the n type conductivity, the AFM shown a strongly changement on the surface of the obtained film for both method. The XRD and Raman show that the deposited films are polycrystalline in nature and crystallize with blende structure in both processes, while the optical properties of the deposited ZnS thin films have a band gap equal to 3.5eV.