Synthesis, structural and optical properties of ZnO thin films

Type : Article de conférence
Auteur(s) :  N. Boussatha, H. Ghoualem
Année :  2016
Domaine : Sciences des matériaux
Conférence: 7th African Conference on Non Destructive Testing (ACNDT) & the 5th International Conference on NDT and Materials Industry and Alloys (IC-WNDT-MI)
Lieu de la conférence:  Oran, Algeria
Résumé en PDF :  (résumé en pdf)
Fulltext en PDF :  (.pdf)
Mots clés :  Oxidize zinc (ZnO), Thin films, sol-gel, spin coating, Force atomic microscopy, optical properties

Résumé : 

In this study we have investigated an economical route for the synthesis of ZnO thin films by sol-gel technique associated with spin-coating deposited onto silicon substrates post annealed at 550°C. Characterizations of the samples were performed by X-ray diffraction (XRD), Atomic Force Microscopy (AFM) and the diffuse reflectance of the films was measured using UV-VIS-NIR spectrophotometer. X-ray diffraction (XRD) of the films showed a hexagonal wurtzite-type structure with a preferential orientation according to the direction . Scherrer’s formula was used to calculate crystallite size. AFM study revealed spherical uniform morphology of ZnO films. Finally, the various optical constants and the optical conductivity were measured.