Morphological Characterization of SEM Thin Silver Films Using Thresholding

Type : Article de conférence
Auteur(s) :  Boudour Samah, DEHCHAR Charif
Année :  2015
Domaine : Electronique
Conférence: The First National Conference on Electronics and New Technologies (NCENT’2015) May 19-20, M'Sila, Algeria
Résumé en PDF :  (résumé en pdf)
Fulltext en PDF :  (.pdf)
Mots clés :  binary image, Image processing, image thresholding, Porosity, segmentation, SEM image, thin silver film

Résumé : 

Thin Silver films given the great well-developed in the materials science and characterization technologies are in high requirement, given the wide-spread use of coatings in many engineering and science fields. In this paper, we report a simple image thresholding method to segment and to distinguish the pores from solid of thin Silver films prepared by electroless-plating deposition method at various plating times. This approach aims to analyze the detected pores on the surface of the studied samples by measuring their porosity, pores size and their distribution